VectorStar™ 系列是 Anritsu 的高級(jí)矢量網(wǎng)絡(luò)分析儀系列，在現(xiàn)代化工作平臺(tái)上提供的整體性能。 MS4640B VectorStar 矢量網(wǎng)絡(luò)分析儀在單臺(tái)儀器中提供 70 kHz 到 70 GHz 的最寬頻率覆蓋范圍。 70 GHz 的頻率固然令人贊嘆，但低頻端額外帶來(lái)的二十倍頻程更令人激動(dòng)。
IMDView™ 提供了靈活的菜單欄，修改關(guān)鍵的IMD參數(shù)時(shí)，可顯示實(shí)時(shí)測(cè)量。內(nèi)部組合選件提供有源器件的單個(gè)連接測(cè)試，可在S參數(shù)和IMD測(cè)量之間自動(dòng)切換，而無(wú)需重新連接DUT。
PulseView™ 脈沖測(cè)量功能, 結(jié)合創(chuàng)新式 IF 數(shù)字化選項(xiàng)，能夠提供業(yè)界的 2.5 ns 脈沖分辨率和 100 dB 動(dòng)態(tài)范圍，對(duì)于不同的占空比，不需要妥協(xié)或平衡性能使用。 PulseView 能夠提供脈沖測(cè)量的實(shí)時(shí)顯示，且能夠同時(shí)動(dòng)態(tài)地修改脈沖參數(shù),以及時(shí)的驗(yàn)證設(shè)計(jì)指標(biāo)。
DifferentialView™ 差分選件, 結(jié)合內(nèi)部雙源選項(xiàng)，能夠提供差分設(shè)備、器件和組件的實(shí)時(shí)顯示分析，且同時(shí)能夠自動(dòng)地修改內(nèi)部雙源的相位和幅度關(guān)系。
噪音系數(shù)測(cè)量選項(xiàng)以冷源技術(shù)為基礎(chǔ)，能夠提高噪音系數(shù)測(cè)量精度。 VectorStar 是僅有的一款能夠測(cè)量 70 kHz 到 125 GHz 噪音系數(shù)的矢量網(wǎng)絡(luò)分析儀，且配有 30 GHz 到 125 GHz 測(cè)量所用的優(yōu)化噪音接收器。 Additionally, VectorStar is the only VNA that offers a Differential Noise Figure option for characterizing the noise figure of differential devices.
在寬帶應(yīng)用中，ME7838 系列通過(guò)一個(gè)同軸測(cè)試端口就能提供跨距為 70 kHz 到 110 GHz，125 GHz 和 145 GHz 的性能和頻率覆蓋范圍。 Anritsu 所開發(fā)的非線性傳輸線技術(shù)的 mmWave 模塊，采用緊湊型設(shè)計(jì)，且同時(shí)能夠提供高達(dá) 145 GHz 高性能。
Anritsu MS4640B 矢量網(wǎng)絡(luò)分析儀提供了更高水平的性能，能夠幫助器件建模工程師實(shí)現(xiàn)精確可靠的器件建模；幫助 R&D 工程師盡量擴(kuò)大其產(chǎn)品設(shè)計(jì)動(dòng)態(tài)范圍，以研發(fā)出的設(shè)備；幫助制造工程師在保證精準(zhǔn)度的情況下地提高其生產(chǎn)測(cè)試效率。 標(biāo)配的 3 年保修，再加上響應(yīng)迅速的銷售支持隊(duì)伍，MS4640B 矢量網(wǎng)絡(luò)分析儀定會(huì)成為工程師的明智選擇。
VectorStar Users Site
The VectorStar Users Site is a location where you can obtain Software, O/S Patches, and needed Utilities for your VectorStar instruments.
The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.
Extraordinary Permittivity Characterization of 4H SiC at Millimeter-wave Frequencies
Lei Li, Mohammad Javad Asadi, School of Electrical and Computer Engineering, Cornell University Steve Reyes, Anritsu Company Patrick Fay, Department of Electrical Engineering, The University of Notre Dame James C. M. Hwang, School of Electrical and Computer Engineering, Cornell University And Department of Materials Science and Engineering, Cornell University. 22 June 2023
Calibration, Repeatability and Related Characteristics of On-wafer, Broadbａnd 70kHz-220 GHz Single-Sweep Measurements
Andrej Rumiantsev, MPI Corporation Jon Martens, Steve Reyes, Anritsu Company. 02 Nov 2020
Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials. 16 Apr 2020
3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; Scientific Reports. 04 Dec 2019
A novel reconfigurable CMOS compatible Ka bａnd bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications. 22 Aug 2019
Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.
Material Measurements
 | Compass Technology Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more. Anritsu and Compass Technology Group Material Measurements Solutions Compass Technology Group VectorStar Integration [video] |
 | Keycom Technologies Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more. Anritsu and Keycom Material Measurement Solution |
 | SWISSto12 Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more. Anritsu and SWISSto12 Material Measurement Solution |
